Atomic Force Microscopy for Energy Research

1999,-

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<P>Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials¿such as lithium-ion batteries, solar cells, and other energy-related materials¿are addressed.</P><P></P><B><P>FEATURES</P></B><P></P><UL><P><LI>First book to focus on application of AFM for energy research</LI><P></P><P><LI>Details the use of advanced AFM and addresses many types of functional AFM tools</LI><P></P><P><LI>Enables readers to operate an AFM instrument successfully and to understand the data obtained</LI><P></P><P><LI>Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy</LI><P></P></UL><P></P><